Optical characterization of InAs delta-layers grown by MBE at different substrate temperatures

نویسندگان

  • J. Hernández-Rosas
  • Julio G. Mendoza-Álvarez
  • S. Gallardo-Hernández
  • E. Cruz-Hernández
  • J. S. Rojas-Ramírez
  • M. López-López
چکیده

InAs layers with thickness of 1 monolayer (d-layers) were grown by MBE embedded in GaAs barriers in the direction [1 0 0]. Photoluminescence (PL) spectroscopy was employed to study the electronic transitions in the d-layers. By secondary-ion mass spectroscopy (SIMS) we checked out the possible In segregation. The samples consist of five InAs d-layers embedded in between 60 nmthick GaAs barriers, such that the electron wave functions do not overlap each other, as we verified with a model of a square quantum well (SQW), which help us to calculate also the well width. r 2008 Elsevier Ltd. All rights reserved.

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عنوان ژورنال:
  • Microelectronics Journal

دوره 39  شماره 

صفحات  -

تاریخ انتشار 2008